List of Figures

•    Synchronisation network architecture for inter-node distribution after [2]
•    Synchronisation network architecture for intra-node distribution after [2]
•    The Synchronisation Network Reference Chain after [2]
•    The network limits in the synchronisation reference chain after [3]
•    Wander accumulation across SDH islands from [3]
•    The TDEV wander mask
•    PRC TDEV wander mask
•    PRC MTIE wander mask
•    SSU TDEV wander mask
•    SSU MTIE wander mask
•    SEC TDEV wander mask
•    SEC MTIE wander mask
•    Maximum wander at PRC outputs in TDEV
•    Maximum wander at PRC outputs in MTIE
•    Maximum wander at SSU outputs in TDEV
•    Maximum wander at SSU outputs in MTIE
•    Maximum wander at SEC outputs in TDEV
•    Maximum wander at SEC outputs in MTIE
•    Maximum wander at PDH outputs in TDEV
•    Maximum wander at PDH outputs in MTIE
•    General model of the noise generated by a SDH synchronisation clock
•    Basic PLL block schematic
•    PLL block schematic
•    Passive filter used in second order PLL's
•    Active filter used in second order PLL's
•    Noise signal with strong low frequency component
•    Noise signal with drift removed by high-pass filtering
•    Frequency Response of TDEV Filter for $\tau=1s$ and $\tau=3s$
•    Power Spectral Densities in Noise Model implemented on SPW
•    Power Spectral Density Relationship
•    PLL Block schematic
•    Modification to ETSI model
•    Illustration of asymptotic expressions obtained
•    SSU TDEV wander mask
•    SEC TDEV wander mask
•    Experimental TDEV data for an SEC from [26]
•    PLL Block schematic
•    Noise Model implemented on SPW
•    Original noise Model implemented on SPW
•    Eventual noise Model implemented on SPW
•    Block diagram showing cascade of unitfilt blocks used to simulate filter A
•    Block diagram of an individual unitfilt block from fig. 7.4
•    SPW block diagram of system for collecting data for SSU TDEV calculation
•    MTIE for 100s and 10000s simulation time
•    SPW block diagram of system for collecting data for SSU MTIE calculation
•    Modification to ETSI model
•    Extended model of a SSU
•    Variant of reference chain simulated
•    SPW block diagram of reference chain--extended model
•    SPW block diagram of reference chain--original model
•    TDEV produced by SSU model satisfying wander mask
•    MTIE produced by SSU model satisfying wander mask
•    TDEV produced by 1Hz SEC model satisfying wander mask
•    MTIE produced by 1Hz SEC model satisfying wander mask
•    TDEV produced by 10Hz SEC model satisfying wander mask
•    MTIE produced by 10Hz SEC model satisfying wander mask
•    Figure illustrating problem with the SEC wander mask
•    TDEV produced by PRC model satisfying wander mask
•    MTIE produced by PRC model satisfying wander mask
•    Wander at SEC output using original ETSI model
•    MTIE after last SEC using original ETSI model
•    TDEV wander at SSU reference output
•    MTIE wander at SSU reference output
•    TDEV wander at SEC reference output
•    MTIE wander at SEC reference output
•    Wander in TDEV at input & output of last SSU
•    Wander in MTIE at input & output of last SSU
•    Early results for the TDEV produced by one SSU highlighting a problem
•    Block diagram of simulation used to test initial SSU model
•    TDEV produced by top and bottom branches of the initial SSU model
•    System considered to test simulation of Filter A
•    TDEV resulting from noise produced by WGN shaped by Filter A
•    Plots of H(s) and H_A(s)
•    TDEV plot verifying appropriate behaviour of interpolated 5Hz bandwidth WGN
•    Plot verifying that the use of the SPW decimate has a minimal effect on TDEV results
•    Decimated and un-decimated white gaussian noise
•    MTIE of an early PRC model for decimated and un-decimated data